RECENT MEASUREMENTS OF LONG-WAVELENGTH X-RAYS USING SYNTHETIC MULTILAYERS

被引：6
|
作者：
HUANG, TC [1 ]
FUNG, A [1 ]
WHITE, RL [1 ]
机构：
[1] IBM CORP,DIV GEN PROD,SAN JOSE,CA 95193
来源：
X-RAY SPECTROMETRY | 1989年 / 18卷 / 02期
关键词：
D O I：
10.1002/xrs.1300180204
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
引用
收藏
页码：53 / 56
页数：4
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