RECENT MEASUREMENTS OF LONG-WAVELENGTH X-RAYS USING SYNTHETIC MULTILAYERS

被引：6

|

作者：

HUANG, TC ^{[1
]}

FUNG, A ^{[1
]}

WHITE, RL ^{[1
]}

机构：

[1] IBM CORP,DIV GEN PROD,SAN JOSE,CA 95193

来源：

X-RAY SPECTROMETRY | 1989年 / 18卷 / 02期

关键词：

D O I：

10.1002/xrs.1300180204

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：53 / 56

页数：4

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