The correction of x-ray diffraction intensities for Lorentz and polarization factor

被引：23

作者：

Buerger, MJ ^{[1
]}

机构：

[1] MIT, Mineral Lab, Boston, MA USA

来源：

PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA | 1940年 / 26卷

关键词：

D O I：

10.1073/pnas.26.11.637

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

收藏

页码：637 / 642

页数：6

相关论文

共 5 条

[1] BOUMAN J, 1938, PHYSICA 5, V9, P817
[2] The photography of interatomic distance vectors and of crystal patterns
Buerger, MJ
[J]. PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 1939, 25 : 383 - 388
[3] Correction factors in the photographic measurement of X-ray intensities in crystal analysis
Cox, EG
Shaw, WFB
[J]. PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-CONTAINING PAPERS OF A MATHEMATICAL AND PHYSICAL CHARACTER, 1930, 127 (804) : 71 - 88
[4] DARWIN CG, 1922, PHILOS MAG, V43, P808
[5] Tunell G, 1939, AM MINERAL, V24, P448