共 5 条
[1]
ON FINDING A NEARLY MINIMAL SET OF FAULT DETECTION TESTS FOR COMBINATIONAL LOGIC NETS
[J].
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS,
1966, EC15 (01)
:66-+
[2]
TECHNIQUES FOR DIAGNOSIS OF SWITCHING CIRCUIT FAILURES
[J].
IEEE TRANSACTIONS ON COMMUNICATION AND ELECTRONICS,
1964, 83 (74)
:509-&
[3]
MALING K, 1963, IEEE T ELECTRONIC CO, VEC12, P887
[4]
POAGE JF, 1963 P S MATH THEOR, P483