BREWSTER AND PSEUDO-BREWSTER ANGLE TECHNIQUE FOR DETERMINATION OF OPTICAL-CONSTANTS

被引:23
作者
AKIMOTO, M
GEKKA, Y
机构
[1] Department of Electronics, Tokai University, Hiratsuka, 259-12
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1992年 / 31卷 / 01期
关键词
PSEUDO-BREWSTER ANGLE; REFRACTIVE INDEX; FRESNEL REFLECTION COEFFICIENT; HYDROGENATED AMORPHOUS SILICON; OPTICAL CONSTANTS;
D O I
10.1143/JJAP.31.120
中图分类号
O59 [应用物理学];
学科分类号
摘要
The analytic solution of the pseudo-Brewster angle, for the case of electromagnetic waves incident from a transparent optical material onto an absorbing material, has been obtained. We have developed a unique measurement method, called the pseudo-Brewster angle method, for obtaining the optical constants of thin films. By this method, the reflected intensity is measured at any angle of incidence. The optical constants are calculated from the pseudo-Brewster angle at the minimum value of the reflection coefficient. As a result, the pseudo-Brewster angle method is very useful for measuring the optical constants of a thin film.
引用
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页码:120 / 122
页数:3
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