ANALYTICAL ELECTRON-MICROSCOPY USING A FIELD-EMISSION GUN

被引：0

作者：

BENTLEY, J ^{[1
]}

机构：

[1] OAK RIDGE NATL LAB,OAK RIDGE,TN 37830

来源：

JOURNAL OF METALS | 1979年 / 31卷 / 12期

关键词：

D O I：

暂无

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

页码：135 / 136

页数：2

共 50 条

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