X-RAY-DIFFRACTION DETERMINATION OF VALENCE-ELECTRON DENSITY IN ALUMINUM NITRIDE

被引：35

作者：

GABE, E ^{[1
]}

LEPAGE, Y ^{[1
]}

MAIR, SL ^{[1
]}

机构：

[1] CSIRO,DIV CHEM PHYS,CLAYTON,VIC 3168,AUSTRALIA

来源：

PHYSICAL REVIEW B | 1981年 / 24卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.24.5634

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：5634 / 5641

页数：8

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