SURFACE CHARACTERIZATION OF MATERIALS AT AMBIENT CONDITIONS BY SCANNING-TUNNELING-MICROSCOPY (STM) AND ATOMIC FORCE MICROSCOPY (AFM)

被引：47
作者：
MAGONOV, SN
机构：
[1] Materials Research Center (F.M.F) of the, Alberts-Ludwig University, W-7800 Freiburg
来源：
APPLIED SPECTROSCOPY REVIEWS | 1993年 / 28卷 / 1-2期
关键词：
D O I：
10.1080/05704929308021499
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
[No abstract available]
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页码：1 / 121
页数：121
相关论文
共 151 条
[1]   THEORETICAL INTERPRETATION OF ATOMIC-FORCE-MICROSCOPE IMAGES OF GRAPHITE [J].
ABRAHAM, FF ;
BATRA, IP .
SURFACE SCIENCE, 1989, 209 (1-2) :L125-L132
[2]   EFFECT OF TIP PROFILE ON ATOMIC-FORCE MICROSCOPE IMAGES - A MODEL STUDY [J].
ABRAHAM, FF ;
BATRA, IP ;
CIRACI, S .
PHYSICAL REVIEW LETTERS, 1988, 60 (13) :1314-1317
[3]   ATOMIC RESOLUTION IMAGING OF A NONCONDUCTOR BY ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
QUATE, CF .
JOURNAL OF APPLIED PHYSICS, 1987, 62 (07) :2599-2602
[4]   IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
DOVEK, MM ;
LANG, CA ;
GRUTTER, P ;
QUATE, CF ;
KUAN, SWJ ;
FRANK, CW ;
PEASE, RFW .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1178-1184
[5]   AN ATOMIC-RESOLUTION ATOMIC-FORCE MICROSCOPE IMPLEMENTED USING AN OPTICAL-LEVER [J].
ALEXANDER, S ;
HELLEMANS, L ;
MARTI, O ;
SCHNEIR, J ;
ELINGS, V ;
HANSMA, PK ;
LONGMIRE, M ;
GURLEY, J .
JOURNAL OF APPLIED PHYSICS, 1989, 65 (01) :164-167
[6]   ATOMIC-SCALE IMAGING OF ANISOTROPIC ORGANIC CONDUCTORS BY SCANNING PROBE TECHNIQUES (STM/AFM) [J].
BAR, G ;
MAGONOV, SN ;
CANTOW, HJ ;
GMEINER, J ;
SCHWOERER, M .
ULTRAMICROSCOPY, 1992, 42 :644-652
[7]  
BAR G, 1993, UNPUB J AM CHEM SOC
[8]  
BAR G, 1991, SYNTHETIC MET, V41, P2335
[9]  
BAR G, 1992, IN PRESS SOLID STATE
[10]  
BAR G, 1992, POLYM PREPR, V33, P777
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